High temperature X-Ray diffraction (HTXRD)
plays an important role in the study of
structural changes at hight temperatures, thermal behaviour, crystallization
processes and
thermal expansion/contraction of matter. HTXRD is usually carried out
with a X-Ray
diffractometer equipped with a high temperature attachment in which the
temperature of
the sample is set to particular value and the X-Ray diffraction pattern
is recorded at that
temperature. It is thus static temperature X-Ray Diffraction. In this
way, a large number
of X-Ray diffraction patterns is required to cover a partucular temperature
range, usually
room temperature to 1500K. The main disadvantage of this static temperature
X-Ray
diffraction method is that a continuous trace of X-Ray Diffraction as
a function of temp-
erature, which possesses enormous potential to disclose minute structural
details, is not
conceiveable.
Some years ago, we have modified the Guinier De Lenne camera to record
X-Ray diff-
raction pattern as a function of temperature on a continuously moving
film, naming this
method as Dynamic Temperature X-Ray Diffraction (DTXD) in contrast
to static tempe-
rature X-Ray diffraction. The continuity of X-Ray diffraction pattern
as a function of temp-
erature reveals details which are unaccessible by static method. For details
see e.g.
crystallization
of glassy materials
For questions and support drop me a mail ( University / Privat )